How Oscilloscopes Will Evolve Over the Next 5 Years

Updated: May 5



Signal Integrity Journal Webinar Series Title: How Oscilloscopes Will Evolve Over the Next 5 Years Available on demand Length: 1 hour, 1 minute Presented by: Steve Sandler, Managing Director, Picotest

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Sponsored by: Rohde & Schwarz Abstract: The power integrity ecosystem is about to be shaken to its very core. The measurements we have relied on for decades will no longer work and will be relegated to the history books.

Due to demands for better transient response, lower noise, and higher efficiency, voltage regulator manufacturers are responding with programmable devices that can change topology on the fly, be programmed to frequency hop (or not), to pulse skip (or not), and allow real time adjustment to nonlinear control loops. Meanwhile, the adoption of much faster GaN and SiC wide band-gap devices is shrinking sizes while improving operating efficiency.

Higher level integration within ASIC devices include several voltage regulators, with a single input and no access to the voltage regulator outputs. There isn’t much left for us to measure! We are losing access to the tried and true measurements we’ve relied on for decades. Meanwhile, engineers are being pummeled with more tasks to complete, each task increasing in technical complexity year over year. They need answers faster! This webinar looks closely at these challenges and suggests how the oscilloscope will likely evolve in order to meet them.

Presenter Bio: Steve Sandler has been involved with power system engineering for more than 40 years. Steve is the founder and CEO of PICOTEST.com, a company specializing in instruments and accessories for high performance power system and distributed system testing. Steve is also the founder of AEi Systems, a company specialized in worst case circuit analysis for high reliability industries. He frequently lectures and leads workshops internationally on the topics of Power Integrity and Distributed Power System Design. He is a Keysight Certified EDA expert. Steve is also a recent Winner of the Jim Williams ACE Award for Contributor of the Year (2015) and a 2-time Test & Measurement Test Engineer of the Year Finalist. He was the recipient of both the DesignCon 2017 and EDICON 2017 Best Paper Awards.

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